Hioki-ST5680 DC HIPOT TESTER ST5680

The DC Hipot Tester ST5680 tests for reliable insulation with a waveform by applying a high voltage to the object under test. The instrument applies a DC voltage between test locations and measures leakage current to determine insulation performance.

Basic Specifications

Accuracy guaranteed: 1 year

Main functions:

• DC Hipot test, Insulation resistance test, Breakdown voltage test, Waveform display functionality, Arc discharge detection, Contact check function
• See 'Various Tests and Functionality' table for details

List of other features:

• Interlock, Auto discharge, Offset cancellation, Variable measurement speed (3 stages), Momentary out, Command monitor, I/O handler test, Key lock, Self-check, Calibration deadline check, EXT SW (Remote control)

Various Tests and Functionality

DC Hipot test:

• Output voltage: DC 0.010 kV to 8.000 kV (1 V resolution)
• Output setting accuracy: ± (1.2% of setting + 20 V)
• Output current/cutoff current: Max. 20 mA
• Current accuracy:
• > 3.00 mA: ±(1.5% rdg. + 2 μA)
• ≤ 3.00 mA: ±1.5% rdg.
• (*1)
• Maximum resolution: 0.001 μA
• Test time: 0.1 s to 999 s, continuous (timer off)
• Voltage ramp up / ramp down time: 0.1 s to 300 s / 0.1 s to 300 s, off
• Short-circuit current: 200 mA or more
• Test modes: W to IR, IR to W, program test

Insulation resistance test:

• Output voltage: 10 V DC to 2000 V (1 V resolution)
• Output setting accuracy: ± (1.2% of setting + 20 V)
• Resistance value display range: 100.0 kΩ to 200.0 GΩ (0.01 kΩ resolution)
• Accuracy guarantee range: 100.0 kΩ to 99.99 GΩ
• Resistance accuracy: ±(1.5% rdg. + 3 dgt.) See 'Insulation resistance measurement accuracy' table for details
• Test time: 0.1 s to 999 s, continuous (timer off)
• Voltage rise/fall time: 0.1 s to 300 s / 0.1 s to 300 s, off

Breakdown voltage test:

• Test method: Continuous voltage rise test, stepped voltage rise test
• Measurement: Insulation breakdown voltage (kV), insulation breakdown strength (kV/mm)
• Settings: Start voltage, end voltage, rise speed, arc detection, electrode distance, upper limit current

Waveform display functionality:

• Waveform display: Voltage, current, insulation resistance
• Sampling rate: 500 kS/s
• Display length setting 0.5 s to 128 s (9 variables)
• Memory capacity: 512 K words

Arc discharge detection:

• Detection method: Monitoring of fluctuations in the test voltage
• Settings: Test voltage variability 1% to 50%

Contact check functionality:

• Detection method: Capacitance measurement method
• Settings: Threshold (capacitance) setting 1.0 nF to 100.0 nF

Memory functionality:

• - Saving of waveforms/graphs:
• Save to USB memory
• Save formats: BMP, PNG, CSV 
• - Panel memory function:
• Saves test condition settings internally in the instrument
• DC withstand voltage testing/insulation resistance testing: Up to 64 sets of settings each
• Program testing: Up to 30 programs (max. 50 steps)
• Insulation breakdown voltage testing: Up to 10 sets of settings
• - Data memory function
• Saves measured values in the instrument’s internal memory (up to 32,000 values)

Judgment functionality (Judgment output):

• PASS judgment, FAIL judgment (UPPER FAIL, LOWER FAIL)
• UPPER_FAIL : Measured value > upper limit value
• PASS : Upper limit value ≥ measured value ≥ lower limit value
• LOWER_FAIL : Measured value < lower limit value

Insulation Resistance Measurement Accuracy

Accuracy guaranteed test voltage range: 50 V to 2000 V

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The DC Hipot Tester ST5680 tests for reliable insulation with a waveform by applying a high voltage to the object under test. The instrument applies a DC voltage between test locations and measures leakage current to determine insulation performance.

Basic Specifications

Accuracy guaranteed: 1 year

Main functions:

• DC Hipot test, Insulation resistance test, Breakdown voltage test, Waveform display functionality, Arc discharge detection, Contact check function
• See 'Various Tests and Functionality' table for details

List of other features:

• Interlock, Auto discharge, Offset cancellation, Variable measurement speed (3 stages), Momentary out, Command monitor, I/O handler test, Key lock, Self-check, Calibration deadline check, EXT SW (Remote control)

Various Tests and Functionality

DC Hipot test:

• Output voltage: DC 0.010 kV to 8.000 kV (1 V resolution)
• Output setting accuracy: ± (1.2% of setting + 20 V)
• Output current/cutoff current: Max. 20 mA
• Current accuracy:
• > 3.00 mA: ±(1.5% rdg. + 2 μA)
• ≤ 3.00 mA: ±1.5% rdg.
• (*1)
• Maximum resolution: 0.001 μA
• Test time: 0.1 s to 999 s, continuous (timer off)
• Voltage ramp up / ramp down time: 0.1 s to 300 s / 0.1 s to 300 s, off
• Short-circuit current: 200 mA or more
• Test modes: W to IR, IR to W, program test

Insulation resistance test:

• Output voltage: 10 V DC to 2000 V (1 V resolution)
• Output setting accuracy: ± (1.2% of setting + 20 V)
• Resistance value display range: 100.0 kΩ to 200.0 GΩ (0.01 kΩ resolution)
• Accuracy guarantee range: 100.0 kΩ to 99.99 GΩ
• Resistance accuracy: ±(1.5% rdg. + 3 dgt.) See 'Insulation resistance measurement accuracy' table for details
• Test time: 0.1 s to 999 s, continuous (timer off)
• Voltage rise/fall time: 0.1 s to 300 s / 0.1 s to 300 s, off

Breakdown voltage test:

• Test method: Continuous voltage rise test, stepped voltage rise test
• Measurement: Insulation breakdown voltage (kV), insulation breakdown strength (kV/mm)
• Settings: Start voltage, end voltage, rise speed, arc detection, electrode distance, upper limit current

Waveform display functionality:

• Waveform display: Voltage, current, insulation resistance
• Sampling rate: 500 kS/s
• Display length setting 0.5 s to 128 s (9 variables)
• Memory capacity: 512 K words

Arc discharge detection:

• Detection method: Monitoring of fluctuations in the test voltage
• Settings: Test voltage variability 1% to 50%

Contact check functionality:

• Detection method: Capacitance measurement method
• Settings: Threshold (capacitance) setting 1.0 nF to 100.0 nF

Memory functionality:

• - Saving of waveforms/graphs:
• Save to USB memory
• Save formats: BMP, PNG, CSV 
• - Panel memory function:
• Saves test condition settings internally in the instrument
• DC withstand voltage testing/insulation resistance testing: Up to 64 sets of settings each
• Program testing: Up to 30 programs (max. 50 steps)
• Insulation breakdown voltage testing: Up to 10 sets of settings
• - Data memory function
• Saves measured values in the instrument’s internal memory (up to 32,000 values)

Judgment functionality (Judgment output):

• PASS judgment, FAIL judgment (UPPER FAIL, LOWER FAIL)
• UPPER_FAIL : Measured value > upper limit value
• PASS : Upper limit value ≥ measured value ≥ lower limit value
• LOWER_FAIL : Measured value < lower limit value

Insulation Resistance Measurement Accuracy

Accuracy guaranteed test voltage range: 50 V to 2000 V

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• Compare this item